New Embedded Testing Article: Find More Bugs in Embedded C Software

Dec 1, 2011

Posted by Parasoft

embedded testingAlthough software verification techniques can help developers find specific types of defects in embedded C software, they can overlook some errors. To rest assured that defects aren’t slipping through the cracks, developers should apply complementary techniques in concert.

embedded c testingRead the Integrating error-detection techniques to find more bugs in embedded C software article by Parasoft's Marek Kucharski and Miroslaw Zielinski to learn how automated techniques such as pattern-based static code analysis, runtime memory monitoring, unit testing, and flow analysis can be used together to find bugs in an embedded C application.

The article demonstrates the recommended bug-finding strategies in the context of a simple sensor application running on an ARM  Cortex-M3 board.

***

To explore additional embedded testing  white papers, articles, and videos/webinars, visit our Embedded Testing Resource Center. Or, visit the Parasoft Embedded page.



New Call-to-action